||FE-SEM analysis of hard disk device
||“FE-SEM analysis of hard disk device“
MR (Magneto Resistive) head was investigated using high resolution FE-SEM. Its multilayer structures including 4.2 nm metal layer in write head and 3.3 nm insulator layer in read element were observed. Defect in diamond-like carbon (DLC) protective layer was clearly visualized. Shape and size of magnetic particles on 3.5-inch disk were non-destructively evaluated at high magnification (1,000,000x).
Further details can be found on our membership website with data library.
Looking forward to your joining.
About our membership site, see https://www.hitachi-hightech.com/global/science/guide/
||Field Emission Scanning Electron Microscopes (FE-SEM)
||Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
||Technical Data / Data Sheet