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Title Automatic particle inspection using the EM-AI
Details HTD-SEM-E133
Overview “Automatic particle inspection using the EM-AI“

Latex particles prepared on nano-percolator (polycarbonate membrane filter) was analyzed using AI(Artificial Intelligence)-enhanced particle analysis software, EM-AI. After supervised learning using 40 training images, 1 μm foreign particles in 474 nm latex particles were automatically detected without false detection of aggregated particles or particles with similar size.

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Related links (products)
Product type Scanning Electron Microscopes (SEM)
Field 1 Chemicals
Field 2 Polymers / Tire / Gum
Information type Technical Data / Data Sheet
Issue date 2020/04/21
Inquiry Inquiry
No. HTD-SEM-E133