Hitachi

サイト名称 日立ハイテク

  • Top
  • App List
  • Observation of interface structure of SiC- diamond
Title Observation of interface structure of SiC- diamond composites
Details HTD-FIB-E082
Overview Observation of interface structure of SiC- diamond composites
Related links (products)
Product type ・Focused Ion Beam Systems (FIB)
・Transmission Electron Microscopes (TEM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Data / Data Sheet
Issue date 2020/05/20
Inquiry Inquiry
No. HTD-FIB-E082