Title | Observation of interface structure of SiC- diamond composites |
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Details | HTD-FIB-E082 |
Overview | Observation of interface structure of SiC- diamond composites |
Related links (products) | |
Product type | ・Focused Ion Beam Systems (FIB) ・Transmission Electron Microscopes (TEM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals |
Information type | Technical Data / Data Sheet |
Issue date | 2020/05/20 |
Inquiry | Inquiry |
No. | HTD-FIB-E082 |