Title | Lamella preparation of semiconductor device for TEM observation |
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Details | HTD-FIB-E083 |
Overview | “Lamella preparation of semiconductor device for TEM observation“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Related links (products) | |
Product type | ・Focused Ion Beam Systems (FIB) ・Transmission Electron Microscopes (TEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2020/07/02 |
Inquiry | Inquiry |
No. | HTD-FIB-E083 |