Title | Large area cross-sectioning of arbitrary sample position by combined process of |
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Details | HTD-FIB-E085 |
Overview | “Large area cross-sectioning of arbitrary sample position by combined process of the IM and FIB“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Related links (products) | |
Product type | ・Focused Ion Beam Systems (FIB) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2020/07/02 |
Inquiry | Inquiry |
No. | HTD-FIB-E085 |