サイト名称 日立ハイテク

  • Top
  • App List
  • Cross-section observation of the IR cut-off filter
Title Cross-section observation of the IR cut-off filter
Details HTD-SEM-E147
Overview ”Cross-section observation of the IR cut-off filter”

Cross section of an Infrared (IR) cut-off filter was prepared using BIB (Broad Ion Beam) milling system. Compared with the torn surface, BIB milling creates a highly polished cross section without uneven profile. Thin layers containing Ti down to 25 nm were clearly visualized by low voltage SEM (0.8 kV) and EDX mapping (6 kV).

Further details can be found on our membership website with data library.
Looking forward to your joining.
About our membership site, see
Related links (products)
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Glass / Ceramics / Minerals / Biominerals
Information type Technical Data / Data Sheet
Issue date 2020/11/05
Inquiry Inquiry
No. HTD-SEM-E147