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Title Cross-section observation of the IR cut-off filter
Details HTD-SEM-E147
Overview ”Cross-section observation of the IR cut-off filter”

Cross section of an Infrared (IR) cut-off filter was prepared using BIB (Broad Ion Beam) milling system. Compared with the torn surface, BIB milling creates a highly polished cross section without uneven profile. Thin layers containing Ti down to 25 nm were clearly visualized by low voltage SEM (0.8 kV) and EDX mapping (6 kV).

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Related links (products)
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Glass / Ceramics / Minerals / Biominerals
Information type Technical Data / Data Sheet
Issue date 2020/11/05
Inquiry Inquiry
No. HTD-SEM-E147