| Overview |
”Cross-section observation of the IR cut-off filter”
 Cross section of an Infrared (IR) cut-off filter was prepared using BIB (Broad Ion Beam) milling system. Compared with the torn surface, BIB milling creates a highly polished cross section without uneven profile. Thin layers containing Ti down to 25 nm were clearly visualized by low voltage SEM (0.8 kV) and EDX mapping (6 kV).
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