Application Data
Semiconductor
3D reconstruction from serial section SEM images
![3D NAND flash memory](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLuAAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: 3D NAND flash memory
(a) Schematic view
(b) Cross-sectional BSD image (Accelerating voltage : 2 kV)
(c) 3D reconstructed image (Volume rendering)
Curtain effect free lamella preparation using double tilt system
![3D NAND flash memory](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLvAAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: 3D NAND flash memory
Observation: HF-3300 Cold FE-TEM (Accelerating voltage : 200 kV)
High-precision site-specific lamella preparation
![22 nm FinFET](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLwAAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: 22 nm FinFET
Observation: HF-3300 Cold FE-TEM (Accelerating voltage : 200 kV)
High-quality lamella preparation with in-situ Ar ion milling
![GaN/InGaN](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLxAAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: GaN/InGaN
Final milling: 1 kV Ar
Observation: HD-2700 Aberration -corrected STEM (Accelerating voltage : 200 kV)
Material Science
High-quality lamella preparation with in-situ Ar ion milling (1)
30 kV FIB
![30 kV FIB](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLyAAM&oid=00D28000000TaoM&lastMod=1501469229000)
1 kV Ar
![1 kV Ar](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHLzAAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: Zirconium
Observation: HF-3300 cold FE-TEM (Accelerating voltage: 300 kV)
High-quality lamella preparation with in-situ Ar ion milling (2)
30 kV FIB
![30 kV FIB](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHM0AAM&oid=00D28000000TaoM&lastMod=1501469229000)
1 kV Ar
![1 kV Ar](https://biz.hitachi-hightech.com/sinavi/servlet/servlet.ImageServer?id=01528000004qHM1AAM&oid=00D28000000TaoM&lastMod=1501469229000)
Specimen: Aluminium
Observation: HF-3300 cold FE-TEM (Accelerating voltage: 300 kV)