サイト名称 日立ハイテク

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The Future of Tabletop Microscopes is Here!

The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 II and TM4000Plus II.

Features

A quality image can be obtained with simple steps.

Automation, Observation, and Elemental Analysis

Easy to switch images with one-click.

Rapid acquisition of elemental maps *2


Sample : Movement of watch

*1
Secondary electron images and MIX images can only be observed in TM4000Plus II
*2
Option

Intuitive operation on Camera Navi *

Use of optical images helps navigate to target observation area easily.
Obtained SEM images can be layered on a SEM MAP image.


Sample: Movement of watch

*
Option: Camera Navigation System

Report Creator

Simply select images and a template to create a customized reports.
Created reports can be saved/edited in Microsoft Office® formats.


Sample : Movement of watch
The image on the screen includes options.

Various imaging applications using 4-under low vacuum status.

Charge-up reduction mode

Charge on a sample can be reduced by one-click.

Image a variety of materials under low vacuum condition

The images show observations of non-conductive samples such as ink toner particles and a hydrated leaf surface.


Sample: Paint ink
Accelerating voltage: 5 kV
Image signal: BSE
Magnification: 2,500x


Sample: Leaf of plant
Accelerating voltage: 10 kV
Image signal: SE
Magnification: 100x

Low vacuum SE detector providing surface detail and topography

Innovative secondary-election detector to obtain surface detail with non-conductive samples at lower vacuum conditions

The TM4000Plus II can observe not only conductive samples, but also non-conductive or hydrated samples without sample preparation. Switching between BSE and SE can be performed easily.

High-sensitivity Low vacuum SE Detector (UVD)

Hitachi's UVD generates secondary-electron images by detecting visible light excited by electron gas interactions.


Accelerating voltage: 5 kV
Image signal: SE
Magnification: 800x


Sample: Printed paper
Accelerating voltage: 5 kV
Image signal: BSE
Magnification: 800x

Advantages of 20 kV accelerating voltage

High accelerating voltage  enables higher-speed EDS analysis.

EDS mapping data at 20 kV in 2 min


Sample: Electronic components

Multi Zigzag (Option)

A function that takes multiple high-magnification images and stitches them together to create a single high-resolution image.


Sample: Japanese ancient coin
Accelerating voltage: 15 kV
Image signal: SE
Magnification: 30x
Field of view 10 vertically × 12 horizontally
(some parts were trimmed)

Specifications

Model nameTM4000Plus IITM4000 II
Magnifications10× - 100,000× (Photographic magnification)
25× - 250,000× (monitor display magnification)
Accelerating voltage5 kV, 10 kV, 15 kV, 20 kV
Image signalBackscattered electron
Secondary electron
Mix (Backscattered electron + Secondary electron)
Backscattered electron
Vacuum modeBSE: Conductor/Standard/Charge-up reduction
SE: Standard/Charge-up reduction
Mix: Standard/Charge-up reduction
BSE: Standard/Charge-up reduction
Sample stage traverseX: 40 mm, Y: 35 mm
Maximum sample size80 mm (diameter), 50 mm (thickness)
Electron gunPre-centered cartridge tungsten filament
Signal detection systemHigh-Sensitivity 4-segment BSE detector
High-Sensitivity Low-Vacuum SE detector (UVD)
High-Sensitivity 4-segment BSE detector
Evacuation system
(vacuum pump)
Turbo molecular pump : 67 L/s×1 unit
Diaphragm pump : 20 L/min×1 unit
Size / weightMain unit (motorized stage): 330 (width)×614 (depth)×547 (height) mm, 54 kg
Main unit (manual stage): 330(width)×617(depth)×547(height) mm, 54 kg
Diaphragm pump: 144 (width)×270 (depth)×216 (height) mm, 5.5kg